Non-Contact, Non-Destructive Testing in Various Industrial Sectors with Terahertz Technology
نویسندگان
چکیده
منابع مشابه
Continuous-Wave Terahertz Spectroscopy as a Non-Contact Non- Destructive Method for Characterising Semiconductors
Using the technique of terahertz photomixing, a continuous-wave terahertz source is used to characterise various semiconductors in the frequency range from 0.06 to 1.0 THz. By directly analysing the interference pattern of the transmission through semiconductor wafers using Fabry-Pérot theory, information regarding the carrier concentration, sample thickness and refractive index is obtained wit...
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ژورنال
عنوان ژورنال: Sensors
سال: 2020
ISSN: 1424-8220
DOI: 10.3390/s20030712